‍EMVA 1288 measurements

‍‍‍‍‍Machine vision camera measurements using the AEON camera calibrator

ACC

The AEON Camera Calibrator (ACC) is a modular optical system designed to test machine vision cameras based directly on the measurement parameters outlined in the EMVA (European Machine Vision Association)1288 standard, including linearity, noise, sensitivity, spatial inhomogeneities, and dark current.

The ACC is available in two sizes, one designed for standard sensors and another capable of handling sensors with diagonals up to 80 mm. It utilizes adjustable LED light sources and evaluation software.

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Happy Holidays

Happy Holidays

From all of us at Image Engineering, we wish you and your families a happy holiday season. We hope 2024 has been a successful year and you continue improving your camera systems' image quality performance. As we look towards a new year, we would like to take a moment to thank you for your support, and, as always, we are excited to assist you on your road to higher camera performance.

 

‍VLS 1.2 – Temporal Recording

‍‍‍‍‍Introducing temporal recording features to VLS

VLS-Evaluation

We are pleased to announce an update to the VLS (Versatile Light System) evaluation software. Version 1.2 introduces a temporal recording function, allowing you to capture one image per luminance step. The test results can be used to evaluate your camera system's CTA (contrast transfer accuracy), CSNR (contrast signal-to-noise ratio), and dynamic range performance.

The main benefit of temporal recording measurements is avoiding issues with flare that often occur during camera alignment to a light source, leading to more accurate test results. The VLS now supports spatial and temporal recording measurements as outlined in the IEEE-P2020 standard.

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‍‍Replacing fluorescent light sources

‍‍‍‍The lightSTUDIO-AW introduces adaptive white technology

iQ-Lab

The lightSTUDIO-AW uses adaptive white technology and replaces the previous lightSTUDIO-S versions that used fluorescent lighting. It will be available with CRI > 90 or CRI ≥ 95. It also has twin functionality, allowing you to insert a dividing wall to split the test scene into a side-by-side comparison under two separate light spectrums. Overall, the AW version offers a powerful alternative to fluorescent and also halogen light sources.

The lightSTUDIO is one of our most popular products because it can replicate the same test specifications in labs worldwide. It is also an ideal product for new test labs looking for an all-around solution for image quality testing.

Check out all of the lightSTUDIO variations that we offer on our website.

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‍iQ-Lab: Standardized testing

‍‍‍‍‍Testing cameras using the latest ISO, IEC, IEEE, etc. standards

Timing measurements

Camera system engineers rely on many applicable international standards to guide their camera development. These standards are regularly updated to maintain relevance as the technology and requirements continue to advance. Many of our test engineers are members of the working groups responsible for updating the standards, thus giving us firsthand experience in the test methods and camera test equipment outlined in the standards.

Typically, cameras must be tested and calibrated for multiple image quality performance factors. When you order a test through our lab, you will provide us with your specifications, and we will recommend which combination of tests best suits your needs.

Contact our iQ-Lab today to get started.

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‍Photonics West and Electronic Imaging

‍Join us in San Francisco for the upcoming conferences

We look forward to starting the new year with two of our favorite conferences, SPIE Photonics West and the Electronic Imaging Symposium. Both will take place in San Francisco. At the Photonics West, we will exhibit at the Nynomic Group booth with many other Nynomic companies. We will also exhibit at EI, and CTO Uwe Artmann will present a paper on "Extending the Utility of Noise Equivalent Quanta (NEQ) for Dynamic Range Measurements in Imaging Systems.

We look forward to seeing you all there!

See Conferences